PROGRAM PATTERN ANALYZING DEVICE, PATTERN APPEARANCE STATUS INFORMATION PRODUCTION METHOD, PATTERN INFORMATION CREATION DEVICE AND PROGRAM

• Main Author: OGAWARA TAKASHI
• Format: Patent
• Language: English
• Published: 18.12.2008
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

PROBLEM TO BE SOLVED: To improve a conversion factor by analyzing a source program to be converted, and using the analytic result in a device for converting a source program developed for a specific computer into a source program which can be executed by a computer at conversion destination. SOLUTION: A program pattern analyzing device comprises a pattern information storage section 201 capable of storing one or more items of first instruction pattern information of a first source program; a first source program receiving section 202 for receiving the first source program; a comparison section 203 for taking out one or more items of conversion unit information from the first source program, and for comparing each of the taken-out items of the conversion unit information with the first instruction pattern information stored in the pattern information storage section 201; and a pattern accumulation section 204 for accumulating the compared instruction pattern information which is the information indicating the instruction pattern corresponding to conversion unit information determined by the comparison section 203 to be not matched with any of the items of the first pattern information as the first instruction pattern information in the pattern information storage section 201. COPYRIGHT: (C)2009,JPO&INPIT