TESTER AND DEVICE

PROBLEM TO BE SOLVED: To efficiently test a device for transferring data at very high bit rate. SOLUTION: A tester for testing the to-be-tested device is provided and includes: a capture memory for storing an output pattern received from the to-be-tested device; a header detecting section for readin...

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Bibliographic Details
Main Authors SAWARA ATSUO, NAKAGAWA HIROSHI, HASE KENICHI
Format Patent
LanguageEnglish
Published 04.12.2008
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To efficiently test a device for transferring data at very high bit rate. SOLUTION: A tester for testing the to-be-tested device is provided and includes: a capture memory for storing an output pattern received from the to-be-tested device; a header detecting section for reading the output pattern from the capture memory, and detecting a location corresponding to a header pattern preset in the output pattern; and a determination section for determining the quality of the output pattern based on a comparison result of a pattern after the location corresponding to the header pattern in the output pattern and a corresponding expected value pattern. COPYRIGHT: (C)2009,JPO&INPIT
Bibliography:Application Number: JP20080133623