SLIT SCANNING CONFOCAL MICROSCOPE AND METHOD OF OBTAINING IMAGE

PROBLEM TO BE SOLVED: To provide a slit scanning confocal microscope in which the resolution in the longitudinal direction of a slit is enhanced. SOLUTION: When a Dove prism 11 is inserted between a scanning optical system 6 and an objective lens 7, a luminous flux rotates by 90° and the image of th...

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Bibliographic Details
Main Authors OSAWA HISAO, UNO DAISUKE
Format Patent
LanguageEnglish
Published 28.08.2008
Subjects
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
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Summary:PROBLEM TO BE SOLVED: To provide a slit scanning confocal microscope in which the resolution in the longitudinal direction of a slit is enhanced. SOLUTION: When a Dove prism 11 is inserted between a scanning optical system 6 and an objective lens 7, a luminous flux rotates by 90° and the image of the slit 2 and a scanning direction rotate by 90°. Two kinds of images of an object 7 to be observed are produced by performing imaging in a state where the Dove prism 11 is inserted between the scanning optical system 6 and the objective lens 7 and in a state where the Dove prism 11 is not inserted, these two images are composited, and thus the resolution in the longitudinal direction of the slit 2 is enhanced. COPYRIGHT: (C)2008,JPO&INPIT
Bibliography:Application Number: JP20070031200