BIAS ADJUSTING METHOD
PROBLEM TO BE SOLVED: To provide a bias adjusting method with which electric characteristics of a circuit unit including a bias circuit comprising an adjustable impedance element and a trimmable resistor, for example, can be easily adjusted into desired characteristics. SOLUTION: A circuit unit 13 i...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
21.08.2008
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide a bias adjusting method with which electric characteristics of a circuit unit including a bias circuit comprising an adjustable impedance element and a trimmable resistor, for example, can be easily adjusted into desired characteristics. SOLUTION: A circuit unit 13 is placed on a stage 12 and moved, and a trimming part of a non-illustrated trimmable resistor in the circuit unit is aligned with a laser irradiation head 11a. An external power source 14 is connected to a non-illustrated bias circuit of the circuit unit 13, a supply voltage is varied, characteristics of the circuit unit 13 are measured by a circuit characteristic measuring instrument 16, and a vias voltage Vg0 at a time when desired characteristics can be obtained, is measured by a voltage measuring instrument 15 and stored in a storage device 17. Next, the external power source 14 is detached from the bias circuit, power is supplied from a non-illustrated internal power source to the circuit unit 13 and while a bias voltage of the bias circuit is measured by the voltage measuring instrument 15, the trimming part of the trimmable resistor is irradiated with a laser, and trimming is performed until the bias voltage becomes Vg0. COPYRIGHT: (C)2008,JPO&INPIT |
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Bibliography: | Application Number: JP20070028944 |