DEFECT DETECTION DEVICE FOR OPTICALLY TRANSPARENT FILM

• Main Authors: FURUKAWA MITSUO, AOI MASAKAZU, TOUGEYAMA HIROHIKO, MIYAZAKI TOMOTARO, WATANABE HIROKI
• Format: Patent
• Language: English
• Published: 07.08.2008
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To detect a defect with high accuracy by preventing misrecognition of the air, entering between an optically transparent film and an auxiliary member for observation as a defect. SOLUTION: This device is equipped with a film transport means for conveying the optically transparent film 1 which is an inspection object; an imaging part 5 for imaging the appearance of the optically transparent film; an auxiliary member 2 for observation, arranged on the back of the optically transparent film imaged by the imaging part; an operation part 6 for detecting a defect by analyzing an image acquired by the imaging part; and a film-adhering means for making the optically transparent film adhere to the surface of the auxiliary member for observation. The auxiliary member for observation has substantially the same light reflection characteristic as that of a member on which the optically transparent film is to be stuck as a final product. COPYRIGHT: (C)2008,JPO&INPIT