SYSTEM AND METHOD FOR MEASURING SPECIFIC ABSORPTION RATE

• Main Authors: KINAMI KATSUNORI, ONISHI TERUO, IYAMA TAKAHIRO
• Format: Patent
• Language: English
• Published: 12.06.2008
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TRANSMISSION

PROBLEM TO BE SOLVED: To simplify a specific absorption rate (SAR) estimating procedure, and to calculate precisely a three-dimensional SAR distribution. SOLUTION: This system for measuring quickly a specific absorption rate is prepared with a dielectric medium capable of neglecting the incidence of an electromagnetic wave from a portion other than a dielectric medium surface faced to a cellular phone or the like to be measured, into the dielectric medium, and capable of neglecting sufficiently also the reflection of the electromagnetic wave from a dielectric medium inside. The system has an electric field distribution measuring means for measuring an amplitude and a phase of a two-dimensional electric field distribution on an optional two-dimensional plane (observation face) in the dielectric medium, an electric field distribution estimating means for estimating a three-dimensional electric field distribution in other position in the dielectric medium, based on only an electric field component in parallel to the observation face, and a specific absorption rate distribution calculating means for calculating the three-dimensional SAR distribution, using the three-dimensional distribution of the measured and estimated electric field three components. The three-dimensional SAR distribution and a volume-averaged SAR can be calculated based only on measured results of the electric field components in parallel to the observation face, and the SAR is quickly measured precisely by simple measuring system constitution. COPYRIGHT: (C)2008,JPO&INPIT