DEFECT DETECTING CIRCUIT AND CONTROLLER
PROBLEM TO BE SOLVED: To solve such a problem that circuit scale is enlarged or a defect is erroneously detected in a conventional defect detecting circuit. SOLUTION: The defect detecting circuit includes a detecting circuit 52 detecting quantity of change in an amplitude level of an input signal an...
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Main Author | |
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Format | Patent |
Language | English |
Published |
28.02.2008
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To solve such a problem that circuit scale is enlarged or a defect is erroneously detected in a conventional defect detecting circuit. SOLUTION: The defect detecting circuit includes a detecting circuit 52 detecting quantity of change in an amplitude level of an input signal and outputting it as a tilt detecting signal, a comparing voltage control circuit 54 changing a level of comparing voltage Vcomp in accordance with an amplitude level of the input signal, and a comparing circuit 53 comparing a level of the tilt detecting signal with a level of the comparing voltage Vcomp and outputting a control signal. COPYRIGHT: (C)2008,JPO&INPIT |
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Bibliography: | Application Number: JP20060218771 |