ULTRASONIC FLAW INSPECTION DEVICE AND ULTRASONIC FLAW INSPECTION PROGRAM

• Main Authors: HAYASHI TAKASHI, FUKUTOMI HIROYUKI
• Format: Patent
• Language: English
• Published: 06.12.2007
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To carry out a plurality of ultrasonic flaw inspection methods so as to change-over using a simple operation. SOLUTION: An ultrasonic flaw inspection device has a switching circuit, capable of arbitrarily changing over a first probe and a second probe with respect to the transm...