ULTRASONIC FLAW INSPECTION DEVICE AND ULTRASONIC FLAW INSPECTION PROGRAM

• Main Authors: HAYASHI TAKASHI, FUKUTOMI HIROYUKI
• Format: Patent
• Language: English
• Published: 06.12.2007
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To carry out a plurality of ultrasonic flaw inspection methods so as to change-over using a simple operation. SOLUTION: An ultrasonic flaw inspection device has a switching circuit, capable of arbitrarily changing over a first probe and a second probe with respect to the transmission part and receiving part of a flaw detector. The switching circuit can select a first mode for performing a flaw detection test by oblique angle flaw inspection method for performing the transmission and reception of an ultrasonic beam by the first probe; a second mode for transmitting the ultrasonic beam by the first probe and performing a flaw inspection test by an SPOD method and receiving the diffracted waves by the second probe; a third mode for transmitting the ultrasonic beam by the first probe, while receiving the reflected waves by the first probe to perform the flaw inspection test by a combination of the oblique angle flaw inspection method for receiving the diffracted waves by the second probe and the SPOD method, and a fourth mode for performing the flaw inspection test by vertical flaw inspection method for performing the transmission and reception of the ultrasonic beam by the second probe. COPYRIGHT: (C)2008,JPO&INPIT