EVALUATION METHOD OF MATERIAL BY THERMOOPTICAL ANALYZING METHOD

PROBLEM TO BE SOLVED: To provide an evaluation method of a material capable of evaluating the structure or characteristics of each of high functional industrial materials, using a T0A method of high sensitivity that is proper in quantitative reproducibility. SOLUTION: In the evaluation method of the...

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Bibliographic Details
Main Author MINOBE MASAO
Format Patent
LanguageEnglish
Published 15.11.2007
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Summary:PROBLEM TO BE SOLVED: To provide an evaluation method of a material capable of evaluating the structure or characteristics of each of high functional industrial materials, using a T0A method of high sensitivity that is proper in quantitative reproducibility. SOLUTION: In the evaluation method of the material using a thermooptical analyzing method which enables transmission of incident polarized light formed by polarizing incident light through or reflected by a sample to be measured, while changing the temperature of the sample to be measured installed on a sample stand equipped with a heating and/or cooling means and the obtained transmitted or reflected light is measured by a photodetector, adhesion preventing interface is provided between the sample stand and the sample to be measured. In a state with no external force applied to the sample to be measured, the measuring area of the sample to be measured is set to an area of 700 μm2or larger, and the temperature change speed of the heating and/or cooling means is set to 30°C/min or lower for performing measurement. COPYRIGHT: (C)2008,JPO&INPIT
Bibliography:Application Number: JP20060123909