TESTING DEVICE AND TESTING METHOD

• Main Author: FUJIBE AKIRA
• Format: Patent
• Language: English
• Published: 08.11.2007
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a testing device and a testing method capable of reducing electric power consumption. SOLUTION: This testing device for testing a plurality of tested devices is provided with a common pattern generation part, a plurality of individual pattern generation parts provided in every of the corresponding tested devices, and a plurality of pattern selection parts for selecting a common pattern or an individual pattern. The individual pattern generation part has a memory for storing the plurality of individual patterns to make the two or more of individual patterns correspond to a different bit field in a data of the same address, and operated synchronizedly with a reference clock, an address pointer part for holding an address stored with the next individual pattern in the memory, a mask part for masking the reference clock input into the memory during a period where the held address is not changed, and a data selection part for selecting sequentially the individual pattern supplied to each cycle from the data read from the memory, to be supplied to the corresponding pattern selection part. COPYRIGHT: (C)2008,JPO&INPIT