METHOD FOR MEASURING TERMINAL HEIGHT OF ELECTRONIC COMPONENT

PROBLEM TO BE SOLVED: To provide a method for measuring a terminal height which measures a height of an electronic component even if a position of the electronic component is deviated in error. SOLUTION: In a method for measuring a terminal height of an electronic component 8 for measuring a height...

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Bibliographic Details
Main Authors WAKABAYASHI CHIEKO, NEMOTO ETSUO, KONNO TAKASHI, HACHIMAN NAOYUKI, ABE YOSHIAKI
Format Patent
LanguageEnglish
Published 27.09.2007
Subjects
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PRINTED CIRCUITS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a method for measuring a terminal height which measures a height of an electronic component even if a position of the electronic component is deviated in error. SOLUTION: In a method for measuring a terminal height of an electronic component 8 for measuring a height of a terminal 9 by a light section method, with a line beam scanning preformed by subjecting the electronic component 8 to pulse lighting by laser beam, a position of the terminal 9 of the electronic component 8 is obtained by continuous lighting of the laser beam, and a laser beam lighting positional correction is performed for measuring the terminal height from the position information thus obtained. COPYRIGHT: (C)2007,JPO&INPIT
Bibliography:Application Number: JP20060243150