OPTICAL PICKUP INSPECTION METHOD AND MANUFACTURING METHOD

• Main Authors: TAKADA KAZUMASA, URASHIMA TAKESATO, FURUTA HIROKAZU, UTSURO HIDETOSHI
• Format: Patent
• Language: English
• Published: 09.08.2007
• Subjects: INFORMATION STORAGE; INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORDCARRIER AND TRANSDUCER; PHYSICS

PROBLEM TO BE SOLVED: To provide a method, enhanced in reliability, for evaluating an optical pickup by solving a problem, in which a reflective film for diffraction grating degrades with aging, and the problem, in which profile accuracy of the diffraction grating is deteriorated associated with density increase in an optical disk, in conventional technology. SOLUTION: The optical pickup inspection method has a first process for emitting a beam from a light source of the optical pickup, a second process for making all of the emitted beam penetrate the diffraction grating and diffract, a third process for making a part of the diffracted beam reflect and irradiate a first light receiving part of the optical pickup, a fourth process for making a part of the diffracted beam penetrate and irradiate a second light receiving part, and a fifth process for evaluating the optical pickup by intensities of light beams irradiated the first light receiving part and the above second light receiving part, respectively. COPYRIGHT: (C)2007,JPO&INPIT