VISUAL INSPECTION SYSTEM

• Main Authors: SENO TAKASHI, TOMIZAWA YUJI
• Format: Patent
• Language: English
• Published: 09.08.2007
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a visual inspection system capable of preventing frequent occurrence of defects by grasping the signs of frequent occurrence of defects in advance. SOLUTION: In this visual inspection system, a visual sensor and a predetermined controller are connected to each other through communication. The visual sensor includes an image pick-up means and a quality quantitative means. The controller includes a data acquisition means for acquiring quantity data obtained from the visual sensor every time inspection objects are inspected, a histogram data creation means for creating histogram data expressing the frequency of occurrence of the quantity data for every quantity area which constitutes a series of quantity areas based on the quantity data acquired sequentially by the data acquisition means, and a soon-occurrence determination means for determining the soon-occurrence of defects based on the predetermined feature of frequency distribution of the quantity data in a series of quantity areas being equivalent to the non-defective on the histogram data created by the histogram data creation means. COPYRIGHT: (C)2007,JPO&INPIT