X-RAY INSPECTION APPARATUS

PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of performing efficient photography in an optimum photography condition while reducing an exposure dose. SOLUTION: A filter optimum for a photography region is determined in advance while maintaining X-ray output constant. The ph...

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Bibliographic Details
Main Author YAMANAKA SEIJI
Format Patent
LanguageEnglish
Published 02.08.2007
Subjects
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