X-RAY INSPECTION APPARATUS
PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of performing efficient photography in an optimum photography condition while reducing an exposure dose. SOLUTION: A filter optimum for a photography region is determined in advance while maintaining X-ray output constant. The ph...
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Main Author | |
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Format | Patent |
Language | English |
Published |
02.08.2007
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Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide an X-ray inspection apparatus capable of performing efficient photography in an optimum photography condition while reducing an exposure dose. SOLUTION: A filter optimum for a photography region is determined in advance while maintaining X-ray output constant. The photography region and the filter are then correlated and stored in a memory section 25 as information. By comparing the information stored in the memory section 25 and a photography region contained in a photography condition inputted when taking a photography, selection of an optimum filter for the photography region and switching of the filters are carried out automatically. COPYRIGHT: (C)2007,JPO&INPIT |
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Bibliography: | Application Number: JP20060009916 |