LASER MICROSCOPE

PROBLEM TO BE SOLVED: To provide a laser microscope capable of detecting a second harmonic wave emitted in a direction opposite to the direction in which incident light advances. SOLUTION: The laser microscope according to the invention includes: a laser light source 10; a phase plate 12 by which a...

Full description

Saved in:
Bibliographic Details
Main Author OIDE TAKAHIRO
Format Patent
LanguageEnglish
Published 15.03.2007
Subjects
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
Online AccessGet full text

Cover

More Information
Summary:PROBLEM TO BE SOLVED: To provide a laser microscope capable of detecting a second harmonic wave emitted in a direction opposite to the direction in which incident light advances. SOLUTION: The laser microscope according to the invention includes: a laser light source 10; a phase plate 12 by which a phase difference according to an incident position is applied to a laser beam from the laser light source 10; an objective lens 16 by which light transmitted through the phase plate 12 is condensed on a specimen 30; a base-wave cut filter 22 by which a second harmonic wave emitted in a direction opposite to the direction in which a laser beam from the specimen 30 advances is separated from a basic wave reflected by the specimen 30; and a photodetector 19 that detects the second harmonic wave separated from the basic wave by the basic wave cut filter 22. COPYRIGHT: (C)2007,JPO&INPIT
Bibliography:Application Number: JP20050249191