APPARATUS AND METHOD FOR SIGNAL ANALYSIS

PROBLEM TO BE SOLVED: To provide an apparatus and a method for signal analysis in which the fitting of a signal is good and exact statistical inspection can be performed when analyzing the signal observed from a subject using a general linear model. SOLUTION: The apparatus for the signal analysis ha...

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Bibliographic Details
Main Author KONO OSAMU
Format Patent
LanguageEnglish
Published 22.02.2007
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Summary:PROBLEM TO BE SOLVED: To provide an apparatus and a method for signal analysis in which the fitting of a signal is good and exact statistical inspection can be performed when analyzing the signal observed from a subject using a general linear model. SOLUTION: The apparatus for the signal analysis has a signal detection unit 21 which acquires the observation signals about the two or more diverging positions of the subject, an independent component signal extraction part 22 which extracts the independent component signal with a mixed matrix by an independent component analysis technique from the acquired observation signals, a fundamental function selection section 23 which selects a fundamental function from an independent component signal, a partial regression coefficient calculation section 24, which expresses the observation signals by the general linear model using the fundamental function and computes a partial regression coefficient, a t value calculation section 25 which calculates a t value for performing certification about the partial regression coefficient, and a t-test section 26 which authorizes the significance of the general linear model by performing the certification based on the computed t value, and performs the statistical inspection. COPYRIGHT: (C)2007,JPO&INPIT
Bibliography:Application Number: JP20050229064