INSTRUMENT FOR MEASURING COMPLEX PERMITTIVITY BY USING CAVITY RESONATOR

PROBLEM TO BE SOLVED: To provide an instrument for measuring complex permittivity of a specimen with high accuracy without being affected by the shape, size, etc. of the specimen. SOLUTION: By forming an opening sufficiently smaller than the wavelengths of electromagnetic wave in a resonant cavity s...

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Bibliographic Details
Main Author TANABE EIJI
Format Patent
LanguageEnglish
Published 12.10.2006
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
TESTING
WAVEGUIDES
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Summary:PROBLEM TO BE SOLVED: To provide an instrument for measuring complex permittivity of a specimen with high accuracy without being affected by the shape, size, etc. of the specimen. SOLUTION: By forming an opening sufficiently smaller than the wavelengths of electromagnetic wave in a resonant cavity such as a spherical resonator 100, an electromagnetic wave leaking from the opening turns into an exponentially decaying evanescent wave. Since this electromagnetic wave can be computer-analyzed, the complex permittivity can be found accurately. The complex permittivity ( = '+j ''≡ '+j(σ/ω' 0)) can be calculated from differences (shift ΔQ of Q and frequency shift Δf are found) between data on a Q-characteristic obtained when no specimen is loaded in an opening part of a probe-type resonator and data on the Q-characteristic obtained when a specimen is loaded therein, based on a relation ΔQ(shift of Q) = g( ', '')Δf(frequency shift) = f( ', ''). COPYRIGHT: (C)2007,JPO&INPIT
Bibliography:Application Number: JP20050092020