ELECTRON DEVICE EQUIPPED WITH NON-EVAPORATING GETTER, AND MANUFACTURING METHOD OF ELECTRON DEVICE
PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method...
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Format | Patent |
Language | English |
Published |
31.08.2006
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Online Access | Get full text |
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Abstract | PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method and a test piece B is manufactured, and by pulverizing the test piece B by a bead mill method, a test piece C and a test piece D are manufactured. The test piece D is pulverized for a longer time than the test piece C. The particles of the test piece C and test piece D are scale-like and the specific surface area becomes very much larger than that of the test piece A and test piece B. The test piece C and the test piece D absorb gas at lower temperatures and much more than the test piece A and test piece B. COPYRIGHT: (C)2006,JPO&NCIPI |
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AbstractList | PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method and a test piece B is manufactured, and by pulverizing the test piece B by a bead mill method, a test piece C and a test piece D are manufactured. The test piece D is pulverized for a longer time than the test piece C. The particles of the test piece C and test piece D are scale-like and the specific surface area becomes very much larger than that of the test piece A and test piece B. The test piece C and the test piece D absorb gas at lower temperatures and much more than the test piece A and test piece B. COPYRIGHT: (C)2006,JPO&NCIPI |
Author | YOKOTA SEIJI TONEGAWA TAKESHI TANIGUCHI MASATERU KUBO YASUMOTO INOUE YOSHIAKI KAWASAKI KAZUHIRO TAKAYAMA SADANORI NAWAMAKI KENJI FUJIMURA YOHEI IDOHARA OSAMU ITO SHIGEO NAMIKAWA MAMORU MARUSHIMA YOSHIHISA |
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Snippet | PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
Title | ELECTRON DEVICE EQUIPPED WITH NON-EVAPORATING GETTER, AND MANUFACTURING METHOD OF ELECTRON DEVICE |
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