ELECTRON DEVICE EQUIPPED WITH NON-EVAPORATING GETTER, AND MANUFACTURING METHOD OF ELECTRON DEVICE

PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method...

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Main Authors NAMIKAWA MAMORU, IDOHARA OSAMU, KAWASAKI KAZUHIRO, FUJIMURA YOHEI, YOKOTA SEIJI, ITO SHIGEO, TAKAYAMA SADANORI, MARUSHIMA YOSHIHISA, TANIGUCHI MASATERU, TONEGAWA TAKESHI, INOUE YOSHIAKI, KUBO YASUMOTO, NAWAMAKI KENJI
Format Patent
LanguageEnglish
Published 31.08.2006
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Abstract PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method and a test piece B is manufactured, and by pulverizing the test piece B by a bead mill method, a test piece C and a test piece D are manufactured. The test piece D is pulverized for a longer time than the test piece C. The particles of the test piece C and test piece D are scale-like and the specific surface area becomes very much larger than that of the test piece A and test piece B. The test piece C and the test piece D absorb gas at lower temperatures and much more than the test piece A and test piece B. COPYRIGHT: (C)2006,JPO&NCIPI
AbstractList PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a non-evaporating getter inside. SOLUTION: The non-evaporating getter material (ZrV) of raw material ( test piece A) is pulverized by a jet mill method and a test piece B is manufactured, and by pulverizing the test piece B by a bead mill method, a test piece C and a test piece D are manufactured. The test piece D is pulverized for a longer time than the test piece C. The particles of the test piece C and test piece D are scale-like and the specific surface area becomes very much larger than that of the test piece A and test piece B. The test piece C and the test piece D absorb gas at lower temperatures and much more than the test piece A and test piece B. COPYRIGHT: (C)2006,JPO&NCIPI
Author YOKOTA SEIJI
TONEGAWA TAKESHI
TANIGUCHI MASATERU
KUBO YASUMOTO
INOUE YOSHIAKI
KAWASAKI KAZUHIRO
TAKAYAMA SADANORI
NAWAMAKI KENJI
FUJIMURA YOHEI
IDOHARA OSAMU
ITO SHIGEO
NAMIKAWA MAMORU
MARUSHIMA YOSHIHISA
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– fullname: KUBO YASUMOTO
– fullname: NAWAMAKI KENJI
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Snippet PROBLEM TO BE SOLVED: To provide a non-evaporating getter material suitable for a getter in an electron device such as a fluorescent arc tube having a...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
Title ELECTRON DEVICE EQUIPPED WITH NON-EVAPORATING GETTER, AND MANUFACTURING METHOD OF ELECTRON DEVICE
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