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Summary:PROBLEM TO BE SOLVED: To provide a plasma processing apparatus which enables the observation of the state of a processed object under a plasma treatment on real time. SOLUTION: A dry etching apparatus 11 includes; a vacuum container 12 where the processed object 1 is arranged at the bottom wall side of an internal space 15; a coil 36 equipped with a conductor arranged above the outside of the vacuum container 12, and equipped with a conductor arranged so that a clearance may be formed as seen by a plane view for generating a plasma; a top wall 16 for closing the upper part of the internal space 15 and having a transparent part 30 at the position corresponding to the clearance between the conductors of the coil 36 as seen in a plane view; and a camera 45 which is arranged above the coil 36 and which can store some processed object at least in the field of view through the clearance between the conductors of the coil 36 and the transparent part 30 of the top wall 16. COPYRIGHT: (C)2006,JPO&NCIPI
Bibliography:Application Number: JP20040380279