EDDY CURRENT PROBE AND EDDY CURRENT ARRAY PROBE

PROBLEM TO BE SOLVED: To provide an eddy current array probe that has improved and more uniform sensitivity to a crack in a radial, axial, or circumferential surface and reduces the variation between channels crossing an array. SOLUTION: The eddy current array probes (ECAPs) have a reinforced drive...

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Bibliographic Details
Main Authors PLOTNIKOV YURI A, MANDAYAM SHYAMSUNDER TONDANUR, MCKNIGHT WILLIAM S, WANG CHANGTING, NATH SHRIDHAR CHAMPAKNATH, TOGO MOTTITO, HENNESSY WILLIAM ANDREW, ERTEL JOHN WILLIAM, GAMBRELL GIGI O
Format Patent
LanguageEnglish
Published 06.07.2006
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide an eddy current array probe that has improved and more uniform sensitivity to a crack in a radial, axial, or circumferential surface and reduces the variation between channels crossing an array. SOLUTION: The eddy current array probes (ECAPs) have a reinforced drive coil configuration. In one array, the ECAPs 10 have a plurality of EC channels 12 and drive coils 14. Each drive coil is disposed in each EC channel. The drive coil has different polarization from an adjacent drive coil. One example, for detecting a flaw with a plurality of scans and in an array configuration, comprises at least one substrate 32, some sensing coils 16 and 18 arranged on the substrate, and the drive coil 14 for surrounding all the sensing coils. COPYRIGHT: (C)2006,JPO&NCIPI
Bibliography:Application Number: JP20050362564