ELECTRON MICROSCOPE DEVICE
PROBLEM TO BE SOLVED: To provide an electron microscope device to carry out analysis of a substance having a periodic structure. SOLUTION: In the electron microscope device, at first a Fourier transformation image of a known period is obtained, and the relationship between the distance on the image...
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| Main Authors | , , |
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| Format | Patent |
| Language | English |
| Published |
02.12.2005
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| Edition | 7 |
| Subjects | |
| Online Access | Get full text |
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| Abstract | PROBLEM TO BE SOLVED: To provide an electron microscope device to carry out analysis of a substance having a periodic structure. SOLUTION: In the electron microscope device, at first a Fourier transformation image of a known period is obtained, and the relationship between the distance on the image and a pixel number is obtained, and this is made as the standard scale. Next, the Fourier transformation image of an analysis target material is obtained and the pixel number of the period of the analysis target is obtained. The size of the period of the analysis target is obtained by using the standard scale. Furthermore, the actual size of a micron marker to direct a prescribed size is obtained by using the standard scale. The micron marker of the obtained size is superimposed on the electron microscopic image and displayed. COPYRIGHT: (C)2006,JPO&NCIPI |
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| AbstractList | PROBLEM TO BE SOLVED: To provide an electron microscope device to carry out analysis of a substance having a periodic structure. SOLUTION: In the electron microscope device, at first a Fourier transformation image of a known period is obtained, and the relationship between the distance on the image and a pixel number is obtained, and this is made as the standard scale. Next, the Fourier transformation image of an analysis target material is obtained and the pixel number of the period of the analysis target is obtained. The size of the period of the analysis target is obtained by using the standard scale. Furthermore, the actual size of a micron marker to direct a prescribed size is obtained by using the standard scale. The micron marker of the obtained size is superimposed on the electron microscopic image and displayed. COPYRIGHT: (C)2006,JPO&NCIPI |
| Author | UEKI YASUMITSU YOTSUTSUJI TAKAFUMI NAGAOKI ISAO |
| Author_xml | – fullname: NAGAOKI ISAO – fullname: UEKI YASUMITSU – fullname: YOTSUTSUJI TAKAFUMI |
| BookMark | eNrjYmDJy89L5WSQcvVxdQ4J8vdT8PV0DvIPdvYPcFVwcQ3zdHblYWBNS8wpTuWF0twMSm6uIc4euqkF-fGpxQWJyal5qSXxXgFGBgamxsZG5qZGjsZEKQIAR4QibQ |
| ContentType | Patent |
| DBID | EVB |
| DatabaseName | esp@cenet |
| DatabaseTitleList | |
| Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Medicine Chemistry Sciences |
| Edition | 7 |
| ExternalDocumentID | JP2005332752A |
| GroupedDBID | EVB |
| ID | FETCH-epo_espacenet_JP2005332752A3 |
| IEDL.DBID | EVB |
| IngestDate | Fri Jul 19 14:38:32 EDT 2024 |
| IsOpenAccess | true |
| IsPeerReviewed | false |
| IsScholarly | false |
| Language | English |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-epo_espacenet_JP2005332752A3 |
| Notes | Application Number: JP20040151829 |
| OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20051202&DB=EPODOC&CC=JP&NR=2005332752A |
| ParticipantIDs | epo_espacenet_JP2005332752A |
| PublicationCentury | 2000 |
| PublicationDate | 20051202 |
| PublicationDateYYYYMMDD | 2005-12-02 |
| PublicationDate_xml | – month: 12 year: 2005 text: 20051202 day: 02 |
| PublicationDecade | 2000 |
| PublicationYear | 2005 |
| RelatedCompanies | HITACHI HIGH-TECHNOLOGIES CORP |
| RelatedCompanies_xml | – name: HITACHI HIGH-TECHNOLOGIES CORP |
| Score | 2.6327689 |
| Snippet | PROBLEM TO BE SOLVED: To provide an electron microscope device to carry out analysis of a substance having a periodic structure. SOLUTION: In the electron... |
| SourceID | epo |
| SourceType | Open Access Repository |
| SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY |
| Title | ELECTRON MICROSCOPE DEVICE |
| URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20051202&DB=EPODOC&locale=&CC=JP&NR=2005332752A |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1RS8MwED7mFPVNp6KbShHpW3Em6dI-FHFpyiyuLbWOvY2l60CEOVzFv-81rrqnvYUcXJKDL5cvyd0B3CJlUG7OmeU4NrMYZbmlnCmzOFOU0-l94egqEcOoN3hl4dgeN-C9joXReUK_dXJERFSOeC_1fr38v8Ty9d_K1Z16w66PhyDzfLNmx-i-usT0-55MYj8WphBemJhRqmWUEm6Txx3YxXM0r-AgR_0qLGW56VOCI9hLUN2iPIZGsWjBgahLr7Vgf7h-8cbmGnyrE2jLZymyNI4MNF0av4g4kYYvR09CnsJNIDMxsHCQyd-SJmGyMSF6Bk3k-sU5GFN3rtwZJ47NKbM5V2qmCEWK4FRVpXrsAjpbFLW3Sjtw-Jt3lFhdcgnN8vOruEKPWqprbYkfirB0aQ |
| link.rule.ids | 230,309,783,888,25576,76876 |
| linkProvider | European Patent Office |
| linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3fT8IwEL4gGvFNUaPgj8WYvS1i29HtgRjpSmCObcFJeCMrzMSYIJEZ_31vlSlPvDW95Npe8vX6tb07gFukDMqdcWY5js0sRtnMUk7KLM4U5TS9zxxdJWIYtvsvzJ_Ykwq8l7EwOk_ot06OiIiaId5zvV8v_y-xPP23cnWn3rDr46GXdDyzZMfovlrE9LodGUdeJEwhOn5shiMto5RwmzzuwC6esXkBBznuFmEpy02f0juEvRjVLfIjqGSLOtREWXqtDvvD9Ys3NtfgWx1DQwZSJKMoNNB0o-hZRLE0PDkeCHkCNz2ZiL6Fg0z_ljT1440J0VOoItfPzsBI3VflzjlxbE6ZzblSc0UoUgSnqCrVZufQ3KKosVV6DbV-MgymwSB8asLBbw5SYrXIBVTzz6_sEr1rrq60VX4AKw53XA |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=ELECTRON+MICROSCOPE+DEVICE&rft.inventor=NAGAOKI+ISAO&rft.inventor=UEKI+YASUMITSU&rft.inventor=YOTSUTSUJI+TAKAFUMI&rft.date=2005-12-02&rft.externalDBID=A&rft.externalDocID=JP2005332752A |