SUCCESSIVE COMPARISON A/D CONVERTER AND COMPARATOR

PROBLEM TO BE SOLVED: To provide a successive comparison A/D converter and a comparator with high accuracy capable of suppressing the effect of a switching noise produced in a MOS semiconductor integrated circuit. SOLUTION: The A/D converter includes a comparison voltage generation circuit 210 for g...

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Bibliographic Details
Main Author KONDO MAMORU
Format Patent
LanguageEnglish
Published 20.10.2005
Edition7
Subjects
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
DECODING
ELECTRICITY
PULSE TECHNIQUE
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Summary:PROBLEM TO BE SOLVED: To provide a successive comparison A/D converter and a comparator with high accuracy capable of suppressing the effect of a switching noise produced in a MOS semiconductor integrated circuit. SOLUTION: The A/D converter includes a comparison voltage generation circuit 210 for generating a comparison voltage for comparing with analog signal voltages; a comparator 220 for successively comparing the comparison voltage with the analog signal voltages, and outputting comparison results; and an comparison result processing circuit 230 for outputting the comparison results to an output register 236 connected to a bus 232, and supplying, to the comparison result generation circuit 210, comparison voltage values determined corresponding to the comparison results. Drive capability of PchTr in the comparator 220 is set to satisfy PchTr 101>PchTr 151, and PchTr 102>PchTr 152. On/off switch timing of PchTr 101 and PchTr 102 having larger drive capability and on/off switch timing of PchTr 151 and PchTr 152 having smaller drive capability are respectively changed by control inputs 153, 154 connected to the gates. COPYRIGHT: (C)2006,JPO&NCIPI
Bibliography:Application Number: JP20040109077