BURN-IN TIME CONTROL METHOD AND DEVICE

• Main Author: IZURU HITOSHI
• Format: Patent
• Language: English
• Published: 11.08.2005
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To perform efficient burn-in time control by performing automatically reexamination of a burn-in time based on accurate failure rate calculation, even when using a burn-in device having no monitor function for confirming the operation state of a device during burn-in, concerning a burn-in time control device for controlling the burn-in time of the burn-in device. SOLUTION: The number of failed IC's and a parameter acquired from a test result of a final test device 20 are accumulated by a number of cumulative failed IC/cumulative parameter calculation part 33. When the cumulative parameters exceeds a prescribed number, the failure ratio is calculated by a failure ratio calculation comparison part 34 from the number of failed IC's and the cumulative parameters calculated by the number of cumulative failed IC/cumulative parameter calculation part 33. Then, the result is compared with a target failure rate to reexamine the burn-in time, and the burn-in time of a dynamic burn-in time device is controlled. COPYRIGHT: (C)2005,JPO&NCIPI