BURN-IN TIME CONTROL METHOD AND DEVICE

PROBLEM TO BE SOLVED: To perform efficient burn-in time control by performing automatically reexamination of a burn-in time based on accurate failure rate calculation, even when using a burn-in device having no monitor function for confirming the operation state of a device during burn-in, concernin...

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Bibliographic Details
Main Author IZURU HITOSHI
Format Patent
LanguageEnglish
Published 11.08.2005
Edition7
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To perform efficient burn-in time control by performing automatically reexamination of a burn-in time based on accurate failure rate calculation, even when using a burn-in device having no monitor function for confirming the operation state of a device during burn-in, concerning a burn-in time control device for controlling the burn-in time of the burn-in device. SOLUTION: The number of failed IC's and a parameter acquired from a test result of a final test device 20 are accumulated by a number of cumulative failed IC/cumulative parameter calculation part 33. When the cumulative parameters exceeds a prescribed number, the failure ratio is calculated by a failure ratio calculation comparison part 34 from the number of failed IC's and the cumulative parameters calculated by the number of cumulative failed IC/cumulative parameter calculation part 33. Then, the result is compared with a target failure rate to reexamine the burn-in time, and the burn-in time of a dynamic burn-in time device is controlled. COPYRIGHT: (C)2005,JPO&NCIPI
Bibliography:Application Number: JP20040019416