ANALYTICAL METHOD FOR OPTICAL PATH CHARACTERISTIC, AND OPTICAL PATH TEST MONITORING SYSTEM

• Main Authors: ARAKI NORIYUKI, IZUMIDA CHIKASHI, HONDA NAGETSU
• Format: Patent
• Language: English
• Published: 09.06.2005
• Edition: 7
• Subjects: ELECTRIC COMMUNICATION TECHNIQUE; ELECTRICITY; MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR; TRANSMISSION

PROBLEM TO BE SOLVED: To provide an analytical method for an optical path characteristic capable of measuring an optical characteristic of an optical path without generating a measuring incapable section, and an optical path test monitoring system. SOLUTION: A waveform in a tailing portion of Fresne...