ANALYTICAL METHOD FOR OPTICAL PATH CHARACTERISTIC, AND OPTICAL PATH TEST MONITORING SYSTEM

PROBLEM TO BE SOLVED: To provide an analytical method for an optical path characteristic capable of measuring an optical characteristic of an optical path without generating a measuring incapable section, and an optical path test monitoring system. SOLUTION: A waveform in a tailing portion of Fresne...

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Bibliographic Details
Main Authors ARAKI NORIYUKI, IZUMIDA CHIKASHI, HONDA NAGETSU
Format Patent
LanguageEnglish
Published 09.06.2005
Edition7
Subjects
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
TRANSMISSION
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Summary:PROBLEM TO BE SOLVED: To provide an analytical method for an optical path characteristic capable of measuring an optical characteristic of an optical path without generating a measuring incapable section, and an optical path test monitoring system. SOLUTION: A waveform in a tailing portion of Fresnel reflection A is substituted with a rear scattering light level just before Fresnel reflection B (substituted waveform W1), in an OTDR waveform appearing with the Fresnel reflections A, B in distances laterally symmetric each other around Fresnel reflection of a termination filter 22 as the center, the rear scattering light level is corrected thereafter in the waveform W1 by a DL of a path loss (level-corrected waveform W2), and a waveform W3 obtained by inverting the waveform W2 to be conformed with a measuring direction (level-inverted waveform W3) is further substituted with that in the same section in the waveform A. COPYRIGHT: (C)2005,JPO&NCIPI
Bibliography:Application Number: JP20030386326