PLASMA ETCHING APPARATUS

PROBLEM TO BE SOLVED: To provide a plasma etching apparatus having a chamber into which gas flows uniformly. SOLUTION: The plasma etching apparatus has the chamber 10, which is equipped with an upper plasma electrode 32 in its upper portion and a lower plasma electrode 31 in its lower portion, respe...

Full description

Saved in:
Bibliographic Details
Main Authors CHOI HEE-HWAN, KIN SHOKO, KYO SEITETSU
Format Patent
LanguageEnglish
Published 31.03.2005
Edition7
Subjects
Online AccessGet full text

Cover

Loading…
Abstract PROBLEM TO BE SOLVED: To provide a plasma etching apparatus having a chamber into which gas flows uniformly. SOLUTION: The plasma etching apparatus has the chamber 10, which is equipped with an upper plasma electrode 32 in its upper portion and a lower plasma electrode 31 in its lower portion, respectively. A plurality of diffuser sheets 70 are disposed between the upper plasma electrode and a gas feed pipe 60 which is connected to the chamber. An electric power generator 40 for applying plasma voltage to the upper and lower plasma electrodes is disposed, a plurality of gas injection nozzles 32a are formed on the upper plasma electrode, and a plurality of auxiliary injection nozzles 70a are formed on the diffuser sheets. COPYRIGHT: (C)2005,JPO&NCIPI
AbstractList PROBLEM TO BE SOLVED: To provide a plasma etching apparatus having a chamber into which gas flows uniformly. SOLUTION: The plasma etching apparatus has the chamber 10, which is equipped with an upper plasma electrode 32 in its upper portion and a lower plasma electrode 31 in its lower portion, respectively. A plurality of diffuser sheets 70 are disposed between the upper plasma electrode and a gas feed pipe 60 which is connected to the chamber. An electric power generator 40 for applying plasma voltage to the upper and lower plasma electrodes is disposed, a plurality of gas injection nozzles 32a are formed on the upper plasma electrode, and a plurality of auxiliary injection nozzles 70a are formed on the diffuser sheets. COPYRIGHT: (C)2005,JPO&NCIPI
Author CHOI HEE-HWAN
KIN SHOKO
KYO SEITETSU
Author_xml – fullname: CHOI HEE-HWAN
– fullname: KIN SHOKO
– fullname: KYO SEITETSU
BookMark eNrjYmDJy89L5WSQCPBxDPZ1VHANcfbw9HNXcAwIcAxyDAkN5mFgTUvMKU7lhdLcDEpuIEW6qQX58anFBYnJqXmpJfFeAUYGBqYGFmZGBhaOxkQpAgAAYiHg
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Edition 7
ExternalDocumentID JP2005086208A
GroupedDBID EVB
ID FETCH-epo_espacenet_JP2005086208A3
IEDL.DBID EVB
IngestDate Fri Jul 19 15:10:10 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_JP2005086208A3
Notes Application Number: JP20040258080
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050331&DB=EPODOC&CC=JP&NR=2005086208A
ParticipantIDs epo_espacenet_JP2005086208A
PublicationCentury 2000
PublicationDate 20050331
PublicationDateYYYYMMDD 2005-03-31
PublicationDate_xml – month: 03
  year: 2005
  text: 20050331
  day: 31
PublicationDecade 2000
PublicationYear 2005
RelatedCompanies SAMSUNG ELECTRONICS CO LTD
RelatedCompanies_xml – name: SAMSUNG ELECTRONICS CO LTD
Score 2.6070309
Snippet PROBLEM TO BE SOLVED: To provide a plasma etching apparatus having a chamber into which gas flows uniformly. SOLUTION: The plasma etching apparatus has the...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
PLASMA TECHNIQUE
PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OFNEUTRONS
PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMICBEAMS
SEMICONDUCTOR DEVICES
Title PLASMA ETCHING APPARATUS
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20050331&DB=EPODOC&locale=&CC=JP&NR=2005086208A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSU4zT0pLMzLUTTEyS9QFNqkTdRNTUw11zY1NjE2SEoFSSaABfV8_M49QE68I0wgmhmzYXhjwOaHl4MMRgTkqGZjfS8DldQFiEMsFvLayWD8pEyiUb-8WYuuiBusdgyblDNVcnGxdA_xd_J3VnJ1tvQLU_IIgcsDWu4GFIzMDK6gdDTpo3zXMCbQtpQC5TnETZGALABqXVyLEwJSaJ8zA6Qy7ek2YgcMXOuMNZEIzX7EIg0SAj2Owr6OCa4gzaIxJwTEgwDHIMSQ0WJRByQ0kqAu0Ih7uoXivACTnGIsxsAB7-qkSDArGaaaJSRYpJqmpZsCAsjBPArUmkhKN00xM0ywSUywlGaTxGCSFV1aagQt86ih4O50MA0tJUWmqLLA-LUmSA4cDAG72dnQ
link.rule.ids 230,309,786,891,25594,76906
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwY2BQSU4zT0pLMzLUTTEyS9QFNqkTdRNTUw11zY1NjE2SEoFSSaABfV8_M49QE68I0wgmhmzYXhjwOaHl4MMRgTkqGZjfS8DldQFiEMsFvLayWD8pEyiUb-8WYuuiBusdgyblDNVcnGxdA_xd_J3VnJ1tvQLU_IIgcsDWu4GFIzMDqznoeF5Q2ynMCbQtpQC5TnETZGALABqXVyLEwJSaJ8zA6Qy7ek2YgcMXOuMNZEIzX7EIg0SAj2Owr6OCa4gzaIxJwTEgwDHIMSQ0WJRByQ0kqAu0Ih7uoXivACTnGIsxsAB7-qkSDArGaaaJSRYpJqmpZsCAsjBPArUmkhKN00xM0ywSUywlGaTxGCSFV1aegdMjxNcn3sfTz1uagQt8Ail4a50MA0tJUWmqLLBuLUmSA4cJACEFeWE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=PLASMA+ETCHING+APPARATUS&rft.inventor=CHOI+HEE-HWAN&rft.inventor=KIN+SHOKO&rft.inventor=KYO+SEITETSU&rft.date=2005-03-31&rft.externalDBID=A&rft.externalDocID=JP2005086208A