SOLID-STATE IMAGE PICKUP ELEMENT

PROBLEM TO BE SOLVED: To improve degradation in sensitivity (shading) near an imaging region in a solid-state image pickup element. SOLUTION: The element has on-chip microlenses 28 each corresponding to each of sensors 23 of an imaging region 42, and a reduction ratio center of exit pupil correction...

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Bibliographic Details
Main Author NATORI TAICHI
Format Patent
LanguageEnglish
Published 04.11.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
SEMICONDUCTOR DEVICES
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Summary:PROBLEM TO BE SOLVED: To improve degradation in sensitivity (shading) near an imaging region in a solid-state image pickup element. SOLUTION: The element has on-chip microlenses 28 each corresponding to each of sensors 23 of an imaging region 42, and a reduction ratio center of exit pupil correction applied to each of the lenses 28 is set at a position O deviated from the center of the imaging region 42. COPYRIGHT: (C)2005,JPO&NCIPI
Bibliography:Application Number: JP20030100750