IMAGE PICK-UP METHOD OF SCANNING INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide an image pick-up method of a scanning inspection device for, especially, picking up images during conveyance and continuously and indirectly exposing a subject, which is provided with a periodical characteristic, to quickly determined good or bad. SOLUTION: At least...

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Bibliographic Details
Main Authors KO RYOIN, KO KAGO
Format Patent
LanguageEnglish
Published 17.06.2004
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide an image pick-up method of a scanning inspection device for, especially, picking up images during conveyance and continuously and indirectly exposing a subject, which is provided with a periodical characteristic, to quickly determined good or bad. SOLUTION: At least one image capture device is provided to pick up an image during conveyance, and captures overlapped images of the subject provided with a periodical characteristic, and continuous indirect exposure is performed to generate overlapped images of unclear, and finally, a relative difference in the overlapped image is taken out to quickly determine good or bad of the subject. COPYRIGHT: (C)2004,JPO
Bibliography:Application Number: JP20020332500