METHOD FOR ERROR ANALYSIS BY COSMIC RAY NEUTRON

PROBLEM TO BE SOLVED: To quickly evaluate soft error analysis by cosmic ray neutrons with over wide-range parameters. SOLUTION: Construction of a device model by a hierachized component, start analysis technique for secondary ions on the basis of the characteristic values of the component, a simple...

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Bibliographic Details
Main Authors IBE HIDEFUMI, KAMEYAMA HIDEAKI, KOIKE YASUO, SAITO YOSHIKAZU
Format Patent
LanguageEnglish
Published 13.05.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
STATIC STORES
TESTING
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Summary:PROBLEM TO BE SOLVED: To quickly evaluate soft error analysis by cosmic ray neutrons with over wide-range parameters. SOLUTION: Construction of a device model by a hierachized component, start analysis technique for secondary ions on the basis of the characteristic values of the component, a simple inputting method and numeralization for a two-dimensional pattern and an error decision method based on them, encapsulation which enables a reuse of midway computation results from nuclear spallation reaction up to charge collection by secondary ions, and a simplified recomputation method for each capsule, are provided. COPYRIGHT: (C)2004,JPO
Bibliography:Application Number: JP20020304182