FLIP-FLOP CIRCUIT WITH SCANNING FUNCTION, SCANNING TEST CIRCUIT, AND SEMICONDUCTOR INTEGRATED CIRCUIT

PROBLEM TO BE SOLVED: To provide a flip-flop circuit with a scanning function for easily detecting an electrically or physically broken transistor. SOLUTION: If a selecting circuit 3 and a clocked invertor 14 which is a part of a master latch part 13a are composed of a compound element 60 for saving...

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Bibliographic Details
Main Authors TOYOOKA TAMOTSU, SAWADA YOSHIHIRO
Format Patent
LanguageEnglish
Published 15.01.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a flip-flop circuit with a scanning function for easily detecting an electrically or physically broken transistor. SOLUTION: If a selecting circuit 3 and a clocked invertor 14 which is a part of a master latch part 13a are composed of a compound element 60 for saving the layout area, a PMOS transistor 2 is provided between an output node 25 of the compound element 60 and a source potential VDD, a controllable TEST signal is inputted to its gate from outside, and the breakage of a NMOS transistor 47 can be detected without controlling the PMOS transistor 40 by the SI signal. COPYRIGHT: (C)2004,JPO
Bibliography:Application Number: JP20020169329