DEFECTIVE ELEMENT DETECTING DEVICE, DEFECTIVE ELEMENT DETECTING METHOD, AND METHOD OF MANUFACTURING SEMICONDUCTOR LASER ELEMENT

• Main Authors: WAKIZAKA TAKESHI, TSUKIJI NAOKI, IWAKURA KIYOMICHI, TAKEUCHI TETSUYA
• Format: Patent
• Language: English
• Published: 22.08.2003
• Edition: 7
• Subjects: BASIC ELECTRIC ELEMENTS; COLORIMETRY; DEVICES USING STIMULATED EMISSION; ELECTRICITY; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PROBLEM TO BE SOLVED: To surely detect a semiconductor laser element which generates kink. SOLUTION: A temperature sensor 2 is connected to a fixed board 1, the temperature sensor 2 is connected to a temperature adjusting and controlling unit 4, and the temperature adjusting and controlling unit 4 is provided to control a temperature adjusting and controlling element 3 allocated under the fixed board 1. On the fixed board 1, a semiconductor laser element 7 and a photo-diode 6 via a mount 5 are allocated. Current is injected to the semiconductor laser element 7 from a variable current source 8 which is controlled with an injection current control unit 9. A data forming unit 11 forms data from the laser beam intensity and injection current value and the data is then outputted from an output unit 12. The kink generated by the semiconductor laser element 7 can surely be detected by maintaining the temperature of the fixed board 1 to the temperature lower by 5 degrees from the design operation temperature. COPYRIGHT: (C)2003,JPO