METHOD AND DEVICE FOR INSPECTING FLATNESS OF PART

PROBLEM TO BE SOLVED: To provide a part flatness inspection device for smooth part mounting operation. SOLUTION: The part flatness inspection device is provided with a laser sensor 101 to be used for inspecting the flatness of a part again after picking up the part and inspecting the position and al...

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Bibliographic Details
Main Authors KIM JONG HONG, OH TAE SEOK
Format Patent
LanguageEnglish
Published 04.07.2003
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
MEASURING
PHYSICS
PRINTED CIRCUITS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a part flatness inspection device for smooth part mounting operation. SOLUTION: The part flatness inspection device is provided with a laser sensor 101 to be used for inspecting the flatness of a part again after picking up the part and inspecting the position and align state of the part by a vision device, a controller 102 arranged on the lower part side of a part supply device 16 and a personal computer (PC) 103 for receiving data from the controller 102 and calculating the flatness of the part. The part flatness inspecting method has a 1st step for checking the position and align state of the part after picking up the part by a head and determining a scanning route, a 2nd step for moving the part to the measurable point of the fixed laser sensor 101 and scanning leads and a 3rd step for algorithm processing of measured data obtained by measuring respective leads of the part at the scanning step and measuring the flatness of the part. COPYRIGHT: (C)2003,JPO
Bibliography:Application Number: JP20020336190