METHOD AND APPARATUS FOR SPECIFYING CAUSE OF ABNORMALITY OF DEVICE

PROBLEM TO BE SOLVED: To certainly specify causes of occurrences of abnormalities of a variety of devices such as a heating device, a cooling device, a sterilizer, a water- treatment device and a food machine. SOLUTION: A method for specifying cause of abnormality of device monitors an operating sta...

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Bibliographic Details
Main Author OKUMURA HIRONOBU
Format Patent
LanguageEnglish
Published 11.04.2003
Edition7
Subjects
BLASTING
CONTROL OR REGULATING SYSTEMS IN GENERAL
CONTROLLING
FUNCTIONAL ELEMENTS OF SUCH SYSTEMS
HEATING
LIGHTING
MECHANICAL ENGINEERING
METHODS OF STEAM GENERATION
MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS
PHYSICS
REGULATING
STEAM BOILERS
STEAM GENERATION
WEAPONS
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Summary:PROBLEM TO BE SOLVED: To certainly specify causes of occurrences of abnormalities of a variety of devices such as a heating device, a cooling device, a sterilizer, a water- treatment device and a food machine. SOLUTION: A method for specifying cause of abnormality of device monitors an operating state of a device 1 and when the abnormalities occur in the device 1, specifies a cause of occurrences of the abnormalities based on a monitoring result related to the cause of the occurrences of the abnormalities. An apparatus for specifying of abnormality of device comprises a monitoring means of the operating state of the device 1, a means 22 of determining the abnormalities of the device 1 based on the monitoring result from the monitoring means, a means 23 of specifying the causes of occurrences of the abnormalities based on the determining result of the abnormalities and the monitoring result and a notifying means 24 of the causes of the occurrences.
Bibliography:Application Number: JP20010295469