MULTI-SPECIMEN ANALYZER

PROBLEM TO BE SOLVED: To improve the operability of a multi-specimen analyzer that measures a plurality of specimens by setting the specimens by making the measurement of the multi-specimen to be performed easily by anyone. SOLUTION: The multi-specimen analyzer which successively measures the compon...

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Bibliographic Details
Main Author YANAGAWA TATSUYA
Format Patent
LanguageEnglish
Published 19.03.2003
Edition7
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To improve the operability of a multi-specimen analyzer that measures a plurality of specimens by setting the specimens by making the measurement of the multi-specimen to be performed easily by anyone. SOLUTION: The multi-specimen analyzer which successively measures the components of the specimens mounted on the analyzer is provided with an interface 7 which successively automatically measures the specimens when a start key 72 is pressed after the specimens are set. It is preferable to install a calibration key 75 which automatically executes calibration by setting a specimen for calibration. It is also preferable to make the tone quality of the sound of a buzzer settable.
Bibliography:Application Number: JP20010274455