APPARATUS AND METHOD FOR INSPECTING LIQUID CRYSTAL PANEL SUBSTRATE
PROBLEM TO BE SOLVED: To provide an apparatus and a method for inspecting a liquid crystal panel substrate wherein whether the supply state of a liquid crystal is satisfactory or not can be judged and measured with satisfactory accuracy. SOLUTION: The inspecting apparatus is provided with a hollow s...
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Main Authors | , , , , |
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Format | Patent |
Language | English |
Published |
05.03.2003
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide an apparatus and a method for inspecting a liquid crystal panel substrate wherein whether the supply state of a liquid crystal is satisfactory or not can be judged and measured with satisfactory accuracy. SOLUTION: The inspecting apparatus is provided with a hollow substrate table 3 on which a substrate 10 supplied with liquid crystals 11 is placed, an imaging means 6 which can be moved in the upper part of the substrate table 3 by a moving means and a control means which controls the substrate table 3 and the imaging means 6. A backlight 9 and a polarizing plate 21 are installed at the substrate table 3, a polarizing plate 20 is installed at a lens part 8 in the imaging means 6, and the polarizing plate 21 at the substrate table 3 and the polarizing plate 20 at the imaging means 6 are arranged so as to become mutually crossed Nicols. |
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Bibliography: | Application Number: JP20010257235 |