TESTING DEVICE FOR SEMICONDUCTOR

PROBLEM TO BE SOLVED: To provide a semiconductor testing device provided with a bus interface device applicable easily to transfer data continuously to a plurality of optional resistors out of a resistor group for conducting data transfer. SOLUTION: Essential constitution concerned in a bus interfac...

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Bibliographic Details
Main Author SHIMURA MICHIO
Format Patent
LanguageEnglish
Published 26.02.2003
Edition7
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor testing device provided with a bus interface device applicable easily to transfer data continuously to a plurality of optional resistors out of a resistor group for conducting data transfer. SOLUTION: Essential constitution concerned in a bus interface is provided with a data number applying part 60 inside a bus I/F part 50, provided with a data number extracting part 20 inside a decoding part 10, and provided with resistor unit R/W control parts 80 for the individual respective resistors R1-Rn. The data number applying part 60 is provided with a function for putting a data number to the corresponding resistor on a tester bus TBUS. The data number extracting part 20 extracts 1 bite of data number carried on the tester bus TBUS, and supplys an extracted data number 20s to the each resistor unit R/W control part 80. The resistor unit R/W control part 80 is provided with a resistor number storage resistor 82 and a consistency detecting part 84.
Bibliography:Application Number: JP20010243408