DEVICE FOR DISPLAYING SUBSTRATE INSPECTION RESULT

• Main Authors: TAKAGAKI TADASHI, KISHIDA KAZUYOSHI
• Format: Patent
• Language: English
• Published: 13.02.2003
• Edition: 7
• Subjects: ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS; CALCULATING; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; COMPUTING; COUNTING; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS; MEASURING; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR; PHYSICS; PRINTED CIRCUITS; TARIFF METERING APPARATUS; TESTING

PROBLEM TO BE SOLVED: To easily obtain overall grasp regarding position and the time as to where and when defects tend to occur, the extent of the occurrence of the defects or the like on the display of inspection results of a plurality of substrates. SOLUTION: In this device, one screen is sectioned into at least three display regions. In a first display region, positions of each solder or each part and occurrence frequency of defects are displayed three-dimensionally; in a second display region, information about a specific defective solder or defective part and the defect content are displayed in different display modes, such as flicker display; in a third display region, the time of occurrence or the like of the defective solder or defective part is displayed by graphs, such as histograms. Display is performed, so that respective display forms are correlated to one another in each sectioned region.