ION SOURCE AND MASS SPECTROMETER USING THE SAME

PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion sourc...

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Main Authors YAMADA MASUYOSHI, TAKADA YASUAKI, KAN MASAO
Format Patent
LanguageEnglish
Published 26.12.2002
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Abstract PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion source to respectively suitable directions in positive ion measurement and negative ion measurement.
AbstractList PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion source to respectively suitable directions in positive ion measurement and negative ion measurement.
Author KAN MASAO
YAMADA MASUYOSHI
TAKADA YASUAKI
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Snippet PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes....
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Title ION SOURCE AND MASS SPECTROMETER USING THE SAME
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