ION SOURCE AND MASS SPECTROMETER USING THE SAME
PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion sourc...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
26.12.2002
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Edition | 7 |
Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To provide an apparatus for efficiently detecting trace components in a sample, in both positive and negative ion measurement modes. SOLUTION: Both types of ions can be sensitively detected by switching the flow direction of sample gas to an ionization area inside the ion source to respectively suitable directions in positive ion measurement and negative ion measurement. |
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Bibliography: | Application Number: JP20010177926 |