WIPER CONTROL DEVICE

PROBLEM TO BE SOLVED: To prevent fault of a device by detecting abnormal condition of FET by determining overheat cut protecting movement by measuring drain voltage, which is difficult to be detected ordinary, and restraining the corresponding FET controlling when abnormality is detected. SOLUTION:...

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Bibliographic Details
Main Authors TORIGOE AKIHIKO, SERIZAWA AKIRA, NAKAZAWA YUICHI
Format Patent
LanguageEnglish
Published 22.05.2002
Edition7
Subjects
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Summary:PROBLEM TO BE SOLVED: To prevent fault of a device by detecting abnormal condition of FET by determining overheat cut protecting movement by measuring drain voltage, which is difficult to be detected ordinary, and restraining the corresponding FET controlling when abnormality is detected. SOLUTION: When FETB (Qb) is ON, the drain voltage is determined whether it is lower than Vpe (1/2VG) or not (step S5). When the drain voltage is lower than the Vpe, it is determined that the drain and the ground short- circuit and the overheat cut protecting movement is functioned, and 1 is added to a fault detecting number times Perror (step S7). The addition value of the fault detecting number times Perror is determined whether it reaches a determination reference value or not (step S11). When it is determined that the fault detecting number times reaches the determination reference value, it is ensured that the drain is actually short-circuited with the ground and the overheat protection cut mechanism is actuated, and movements of FETA (qa) and the FETB (Qb) are stopped (step S13).
Bibliography:Application Number: JP20000348152