EMITTED-LIGHT INTENSITY DISTRIBUTION MEASURING DEVICE

PROBLEM TO BE SOLVED: To provide an emitted-light intensity distribution measuring device by which output values from each photodetector need not be corrected for obtaining accurate measured values. SOLUTION: The emitted-light intensity distribution measuring device has a semiconductor-laser holding...

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Bibliographic Details
Main Author OGUMA NOBUO
Format Patent
LanguageEnglish
Published 29.03.2002
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
DEVICES USING STIMULATED EMISSION
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide an emitted-light intensity distribution measuring device by which output values from each photodetector need not be corrected for obtaining accurate measured values. SOLUTION: The emitted-light intensity distribution measuring device has a semiconductor-laser holding member 1 holding a semiconductor laser 5 at a fixed position, the photodetector 2 receiving emitted light emitted from the semiconductor laser 5, a photo-detector rotary means 3 for circularly moving the photodetector 2 centering around the light-emitting point of the laser 5 or a section in the vicinity of the light-emitting point, and a circular-motion direction changing means 4 for changing the direction of the circular motion of the photodetector 2. The distribution of the intensity of the emitted-light is measured by using output values at each arcuate place of the photodetector 2.
Bibliography:Application Number: JP20000280416