SEMICONDUCTOR DEVICE, MICROCOMPUTER, AND FLASH MEMORY

PROBLEM TO BE SOLVED: To provide a semiconductor device the characteristics of which are adjustable as desired with high reliability without being affected by the variance or the like of device characteristics. SOLUTION: This device is provided with a replica MOS transistor 2 for measuring a current...

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Bibliographic Details
Main Authors YAMAKI TAKASHI, FUJITO MASAMICHI, HIRAKI MITSURU, TANAKA TOSHIHIRO, TAKEUCHI MIKI, SHINAGAWA YUTAKA
Format Patent
LanguageEnglish
Published 15.03.2002
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
PHYSICS
SEMICONDUCTOR DEVICES
STATIC STORES
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor device the characteristics of which are adjustable as desired with high reliability without being affected by the variance or the like of device characteristics. SOLUTION: This device is provided with a replica MOS transistor 2 for measuring a current value connected to an external measuring terminal 3. A delay circuit 4 or the like giving a desirable characteristics has a constant current source MOS transistor formed by the same process as the replica MOS transistor, and trimming voltage Vtri is applied commonly to the constant current source MOS transistor and the replica MOS transistor 2. Trimming data decided based on a current value measured from the external measuring terminal 3 is stored in a storage means 13 such as a non-volatile memory being electrically rewritable. The trimming voltage Vtri is decided by the trimming data.
Bibliography:Application Number: JP20000267044