SPECTRAL ANALYZER

PROBLEM TO BE SOLVED: To provide a spectral analyzer highly precisely measuring a sample even under a condition where a detected light becomes weak. SOLUTION: A spectral analyzer which irradiates a sample with measurement light, measures a spectrum of its transmitted or reflected light, and finds th...

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Bibliographic Details
Main Author NANKO TOMOAKI
Format Patent
LanguageEnglish
Published 06.04.2001
Edition7
Subjects
COLORIMETRY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a spectral analyzer highly precisely measuring a sample even under a condition where a detected light becomes weak. SOLUTION: A spectral analyzer which irradiates a sample with measurement light, measures a spectrum of its transmitted or reflected light, and finds the property value of the sample based on the spectrum is provided with a standard sample absorbing or reflecting the light at a prescribed rate relative to a waveform of the measurement of the measurement light, a standard sample insertion device arranging or not arranging the standard sample in a measurement light path, and a spectrum storage device storing respective spectra when the measurement light transmits or does not transmits the standard sample in a case where the sample is present/absent in the measurement path, and a spectrum correction device correcting the spectrum of the sample using the respective spectrum data stored in the spectrum storage device.
Bibliography:Application Number: JP19990270656