WAVEFORM OBSERVING DEVICE

• Main Authors: AIKAWA MAKOTO, TAKESHITA YUKITO, SATO KENJI
• Format: Patent
• Language: English
• Published: 12.01.2001
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To attain a waveform observing device capable of storing measured data used for average processing in a storage device, selecting an arbitrary measured data out of the measured data stored in the storage device, and conducting average processing by using the measured waveform data selected therein. SOLUTION: This waveform observing device, displaying an input signal in a waveform, is provided with a measuring part 1 measuring an input signal for generating measured waveform data, a storing part 2 storing a plurality of measured waveform data from the measuring part 1, an averaging means 3 generating the average waveform data of the two or more measured waveform data selected from those in the storing part 2, a data controlling means 31 displaying the measured waveform data stored in the storing part 2 and the average waveform data on a display part 4, and a selecting means 5 selecting the measured waveform data from those in the storing part 2.