DEVICE AND METHOD FOR MONITORING AND ANALYZING ELECTRODE

• Main Authors: TOKUDA NOBUYUKI, OGINO SEIJI
• Format: Patent
• Language: English
• Published: 14.07.2000
• Edition: 7
• Subjects: BASIC ELECTRIC ELEMENTS; COLORIMETRY; ELECTRICITY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSIONOF CHEMICAL INTO ELECTRICAL ENERGY; RADIATION PYROMETRY; TESTING

PROBLEM TO BE SOLVED: To enable the degradation state of electrodes to be known during on-site operation by spectrally separating reflected light transmitted by light transmitting members and measuring the spectrum of the reflected light on the basis of a wave number difference from irradiation light. SOLUTION: A tungsten halogen lamp is provided as a light source 50, and monochromatic light is used as irradiation light. Light emitted from the light source 50 is introduced to a light transmitting member 51 via a chopper and a coupler and guided to a part to be measured by the light transmitting member 51. Plastic optical fibers are used as the light transmitting members 51 and 52. The surfaces of electrodes 5 and 6 are irradiated with light emergent from the irradiation end of the optical fiber 51, which is its tip part, and reflected light is received by the irradiation end of the optical fiber 51. The reflected light is introduced to the optical fiber 52, transmitted through it, and guided to a spectroscope 53. For obtaining the spectrum of the reflected light to be obtained by the spectroscope 53, the reflected light is amplified by a photomultiplier tube(PMT) 54 as being subjected to wavelength-driving by a processing device (personal computer) 55.