LCD FUNCTION INSPECTING DEVICE

• Main Author: OGAWARA NAOTO
• Format: Patent
• Language: English
• Published: 28.04.2000
• Edition: 7
• Subjects: DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; FREQUENCY-CHANGING; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF; TESTING

PROBLEM TO BE SOLVED: To obtain an LCD function inspecting device in which impedance caused by connection is reduced and the occurrence of erroneous display is prevented, by conducting a function inspection in which plural probe pins, that are connected to a same signal source, are connected against a single external connection pattern of an LCD. SOLUTION: An LCD driver 2 is connected to an ITO pattern 3 as much as the number of respective segment, the driver 2 is driven by providing a signal from the external to the ITO pattern 3 and acts as a display. Two probe pins 4 are connected to a same terminal of a control BOX 5. By making the probe pins 4 two and making the pins approach and bring into contact with the same ITO pattern 3, impedance is reduced to 1/2. Therefore, the correction for the phases, the waveforms and the timing of the signal is not required. Moreover, even through one piece of the probe pins 4 causes a contact defect, the remaining one pin 4 maintains the connection.