NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND ITS TESTING METHOD

• Main Author: KII YASUYUKI
• Format: Patent
• Language: English
• Published: 07.04.2000
• Edition: 7
• Subjects: INFORMATION STORAGE; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; STATIC STORES; TESTING

PROBLEM TO BE SOLVED: To provide the nonvolatile semiconductor storage device which can test through single measurement whether or not the thresholds of all memory cells are in a proper range after all the memory cells are set in a written or erased state. SOLUTION: This device is provided with a hi...